Journal of Materials Chemistry A, Год журнала: 2024, Номер unknown
Опубликована: Янв. 1, 2024
The H- and T-phases of MA 2 Z 4 structures, elemental composition high-throughput screening process.
Язык: Английский
Journal of Materials Chemistry A, Год журнала: 2024, Номер unknown
Опубликована: Янв. 1, 2024
The H- and T-phases of MA 2 Z 4 structures, elemental composition high-throughput screening process.
Язык: Английский
Materials Today Nano, Год журнала: 2025, Номер unknown, С. 100627 - 100627
Опубликована: Апрель 1, 2025
Язык: Английский
Процитировано
1Materials, Год журнала: 2024, Номер 18(1), С. 104 - 104
Опубликована: Дек. 30, 2024
MXenes, two-dimensional (2D) transition metal carbides and nitrides, have shown promise in a variety of applications. The use MXenes active electronic devices is restricted to electrode materials due their metallic nature. However, can be modified semiconducting used for next-generation channel materials. inherent characteristics pristine M
Язык: Английский
Процитировано
3Solid-State Electronics, Год журнала: 2025, Номер unknown, С. 109100 - 109100
Опубликована: Март 1, 2025
Язык: Английский
Процитировано
0Journal of Material Science and Technology, Год журнала: 2025, Номер unknown
Опубликована: Март 1, 2025
Язык: Английский
Процитировано
0Journal of Industrial and Engineering Chemistry, Год журнала: 2025, Номер unknown
Опубликована: Апрель 1, 2025
Язык: Английский
Процитировано
0ACS Nano, Год журнала: 2025, Номер unknown
Опубликована: Май 2, 2025
Although negative capacitance field-effect transistors (NCFETs) have been extensively studied to overcome the fundamental Boltzmann limit, many prior reports on sub-60 mV/dec subthreshold swings (SS) suffer from inadequate data ranges, measurements near noise floor, and a lack of robust device simulations, raising questions about true efficacy NCFETs. Moreover, recent efforts with MoS2 channels frequently relied mechanically exfoliated flakes, limiting uniformity scalability. Here, we present an NCFET that employs synthetic monolayer channel ferroelectric hafnium zirconium oxide layer in gate stack integrated indium metal contacts. We achieve clearly substantiated subthermionic SS (∼55 mV/dec) across more than two decades drain current, supported by theoretical modeling incorporates interface trap density. Additionally, drain-induced barrier lowering (DIBL)-induced threshold voltage shift, hallmark NCFETs, is distinctly observed. Compared existing 2D van der Waals (vdW) NCFETs rely material, our approach demonstrates reliable reproducible low-voltage operation, underlining its potential for large-area integration. further confirm reducing source/drain contact resistance (achieved contacts) vital successful implementation vdW
Язык: Английский
Процитировано
0Nano-Micro Letters, Год журнала: 2025, Номер 17(1)
Опубликована: Май 13, 2025
Abstract The relentless down-scaling of electronics grands the modern integrated circuits (ICs) with high speed, low power dissipation and cost, fulfilling diverse demands life. Whereas, semiconductor industry entering into sub-10 nm technology nodes, degrading device performance increasing consumption give rise to insurmountable roadblocks confronted by ICs that need be conquered sustain Moore law’s Bulk semiconductors like prevalent Si are plagued seriously degraded carrier mobility as thickness thinning down sub-5 nm, which is imperative maintain sufficient gate electrostatic controllability combat increasingly short channel effects. Nowadays, emergence two-dimensional (2D) materials opens up new gateway eschew hurdles laid in front scaling trend IC, mainly ascribed their ultimately atomic thickness, capability down, dangling-bonds free surface, wide bandgaps tunability feasibility constitute heterostructures. Blossoming breakthroughs discrete electronic device, such contact engineering, dielectric integration vigorous channel-length scaling, or large arrays, boosted yields, improved variations full-functioned processor fabrication, based on 2D have been achieved nowadays, facilitating step under spotlight IC treated most potential future successor complementary counterpart incumbent further IC.
Язык: Английский
Процитировано
0Journal of Materials Chemistry A, Год журнала: 2024, Номер unknown
Опубликована: Янв. 1, 2024
The H- and T-phases of MA 2 Z 4 structures, elemental composition high-throughput screening process.
Язык: Английский
Процитировано
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