A Dual-Constraint Centroid Contrastive Prototypical Network for Flip Chip Defect Detection Under Limited Labeled Data DOI
Yunxia Lou, Lei Su, Jiefei Gu

и другие.

Опубликована: Окт. 31, 2024

Язык: Английский

A Dual-Constraint Centroid Contrastive Prototypical Network for Flip Chip Defect Detection Under Limited Labeled Data DOI
Yunxia Lou, Lei Su, Jiefei Gu

и другие.

Опубликована: Окт. 31, 2024

Язык: Английский

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