Materials, Год журнала: 2025, Номер 18(10), С. 2222 - 2222
Опубликована: Май 11, 2025
The reduction of graphene oxide (GO) is critical for tuning its properties. This study integrates optical contrast analysis with Raman spectroscopy and X-ray photoelectron (XPS) to investigate the structural evolution GO in thermal reduction. For on 100 nm SiO2/Si, R channel exhibits superior sensitivity changes, making it a reliable indicator process. A theoretical model based Fresnel equations reveals role SiO2 thickness modulating contrast, providing guidelines substrate optimization selection.
Язык: Английский