Simultaneous estimation of multiple order phase derivatives using deep learning method in digital holographic interferometry

Optics and Lasers in Engineering, Год журнала: 2024, Номер 184, С. 108583 - 108583

Опубликована: Сен. 13, 2024

Язык: Английский

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Non-destructive surface defect metrology using deep learning and diffraction phase microscopy

Опубликована: Янв. 1, 2024

We present an approach that utilizes a deep learning network to compute phase gradient for defect identification. The efficacy of this method is showcased through the analysis experimentally acquired noisy interferograms.

Язык: Английский

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Deep learning-based automated defect detection in digital holographic microscopy

Опубликована: Янв. 1, 2024

The article introduces a defect identification method using digital holographic microscopy and deep learning. It utilizes wrapped phase from holograms to generate binary maps trained for high noise levels. Experimental results validate its efficacy.

Язык: Английский

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Non-destructive fault diagnosis of electronic interconnects by learning signal patterns of reflection coefficient in the frequency domain

Microelectronics Reliability, Год журнала: 2024, Номер 162, С. 115518 - 115518

Опубликована: Окт. 14, 2024

Язык: Английский

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