Simultaneous estimation of multiple order phase derivatives using deep learning method in digital holographic interferometry

Optics and Lasers in Engineering, Journal Year: 2024, Volume and Issue: 184, P. 108583 - 108583

Published: Sept. 13, 2024

Language: Английский

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Non-destructive surface defect metrology using deep learning and diffraction phase microscopy

Published: Jan. 1, 2024

We present an approach that utilizes a deep learning network to compute phase gradient for defect identification. The efficacy of this method is showcased through the analysis experimentally acquired noisy interferograms.

Language: Английский

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Deep learning-based automated defect detection in digital holographic microscopy

Published: Jan. 1, 2024

The article introduces a defect identification method using digital holographic microscopy and deep learning. It utilizes wrapped phase from holograms to generate binary maps trained for high noise levels. Experimental results validate its efficacy.

Language: Английский

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Non-destructive fault diagnosis of electronic interconnects by learning signal patterns of reflection coefficient in the frequency domain

Microelectronics Reliability, Journal Year: 2024, Volume and Issue: 162, P. 115518 - 115518

Published: Oct. 14, 2024

Language: Английский

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