
Japanese Journal of Applied Physics, Journal Year: 2024, Volume and Issue: 63(10), P. 107001 - 107001
Published: Oct. 1, 2024
Abstract This study delves into the performance and stability of quantum-dot light-emitting diodes (QLEDs), with a specific focus on initial variations in device properties effectiveness various stabilization strategies. We assess impact bias conditions, reverse treatment, thermal annealing zinc oxide electron transport layer (ZnO transporting layer), effects shelf storage reliability efficiency. Our findings reveal that QLEDs are highly sensitive to yet this sensitivity can be significantly reduced through strategic interventions such as applications. These treatments shown markedly enhance operational devices. By providing deep insights mechanisms behind QLED properties, our research outlines practical measures for improving their reliability, profound implications advancement high-performance display technologies.
Language: Английский