Loss Analysis of P3 Laser Patterning of Perovskite Solar Cells via Hyperspectral Photoluminescence Imaging DOI Creative Commons
Christof Schultz,

Markus Fenske,

Nicolas Otto

et al.

Solar, Journal Year: 2025, Volume and Issue: 5(2), P. 13 - 13

Published: April 11, 2025

Upscaling perovskite solar cells and modules requires precise laser patterning for series interconnection spatial characterization of cell parameters to understand laser–material interactions their impact on performance. This study investigates the use nanosecond (ns) picosecond (ps) pulses at varying fluences P3 step cells. Hyperspectral photoluminescence (PL) imaging was employed map key such as optical bandgap energy, Urbach shunt resistance. The mappings were correlated with electrical measurements, revealing that both ns ps lasers can be utilized effective interconnections minimal performance losses optimized fluences. Our findings provide a deeper understanding fluence-dependent effects in patterning. Moreover, results demonstrate process window is robust, allowing reasonable even deviations from optimal parameters. robustness, coupled scalability process, emphasize its suitability industrial module production.

Language: Английский

Loss Analysis of P3 Laser Patterning of Perovskite Solar Cells via Hyperspectral Photoluminescence Imaging DOI Creative Commons
Christof Schultz,

Markus Fenske,

Nicolas Otto

et al.

Solar, Journal Year: 2025, Volume and Issue: 5(2), P. 13 - 13

Published: April 11, 2025

Upscaling perovskite solar cells and modules requires precise laser patterning for series interconnection spatial characterization of cell parameters to understand laser–material interactions their impact on performance. This study investigates the use nanosecond (ns) picosecond (ps) pulses at varying fluences P3 step cells. Hyperspectral photoluminescence (PL) imaging was employed map key such as optical bandgap energy, Urbach shunt resistance. The mappings were correlated with electrical measurements, revealing that both ns ps lasers can be utilized effective interconnections minimal performance losses optimized fluences. Our findings provide a deeper understanding fluence-dependent effects in patterning. Moreover, results demonstrate process window is robust, allowing reasonable even deviations from optimal parameters. robustness, coupled scalability process, emphasize its suitability industrial module production.

Language: Английский

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