Chinese Journal of Polymer Science, Journal Year: 2024, Volume and Issue: unknown
Published: Dec. 25, 2024
Language: Английский
Chinese Journal of Polymer Science, Journal Year: 2024, Volume and Issue: unknown
Published: Dec. 25, 2024
Language: Английский
Chemical Reviews, Journal Year: 2024, Volume and Issue: unknown
Published: Oct. 25, 2024
The copolymerization of CO
Language: Английский
Citations
11International Journal of Extreme Manufacturing, Journal Year: 2024, Volume and Issue: 6(6), P. 062004 - 062004
Published: July 27, 2024
Abstract Sub-wavelength nanostructure lattices provide versatile platforms for light control and the basis various novel phenomena applications in physics, material science, chemistry, biology, energy. The thriving study of is building on remarkable progress nanofabrication techniques, especially possibility fabricating larger-area patterns while achieving higher-quality lattices, complex shapes, hybrid materials units. In this review, we present a comprehensive review techniques large-area fabrication optical arrays, encompassing direct writing, self-assembly, controllable deposition, nanoimprint/print methods. Furthermore, particular focus made recent improvement unit accuracy diversity, leading to integrated multifunctional structures devices applications.
Language: Английский
Citations
7Chemistry of Materials, Journal Year: 2025, Volume and Issue: unknown
Published: Jan. 28, 2025
Language: Английский
Citations
0Chemistry of Materials, Journal Year: 2025, Volume and Issue: unknown
Published: Feb. 27, 2025
Language: Английский
Citations
0Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Journal Year: 2025, Volume and Issue: 43(2)
Published: March 1, 2025
The chemically amplified resist, which contains photoacid generator (PAG), has been widely used in high-volume integrated circuit manufacturing. Conventional resist models represent postexposure bake (PEB) as a diffusion-reaction system involving the diffusion, neutralization, and amplification of unitary acid quencher. However, when resists with multiple PAGs are introduced for advanced process, existing fail to capture complex chemical interactions PAGs. In this study, we propose an extended model that accounts formulation improve accuracy model. Our distinguishes acid-producing capacity considers effects different amplification, neutralization rates on protection group concentration among acids. Thus, can more accurately dynamics response during exposure PEB processes. exemplary simulations demonstrate our offer superior simulation compared conventional physical By calibrating nearly 20 parameters proposed model, it achieves 59% 26% reductions root mean square error critical dimensions test patterns. Those results confirm prediction multi-PAG offering valuable tool simulating optimizing lithography formulation.
Language: Английский
Citations
0Chinese Journal of Polymer Science, Journal Year: 2024, Volume and Issue: unknown
Published: Dec. 25, 2024
Language: Английский
Citations
0