Journal of Sol-Gel Science and Technology, Journal Year: 2024, Volume and Issue: unknown
Published: Dec. 23, 2024
Language: Английский
Journal of Sol-Gel Science and Technology, Journal Year: 2024, Volume and Issue: unknown
Published: Dec. 23, 2024
Language: Английский
Journal of Solid State Electrochemistry, Journal Year: 2024, Volume and Issue: 28(3-4), P. 829 - 845
Published: Jan. 4, 2024
Abstract This paper reviews selected problems, which appear in literature dealing with TiO 2 , SnO and ZnO. Some of them have more universal impact to semiconductor electrochemistry. The electronic band structure is a key for understanding fundamental properties rational design applications, but the uncertainty specific values determined experimentally or by theoretical calculations should not be ignored. inappropriate use Mott-Schottky plot characterization certain electrodes another source problems. other technical formal issues research development semiconductors are discussed.
Language: Английский
Citations
23Materials Science in Semiconductor Processing, Journal Year: 2025, Volume and Issue: 189, P. 109299 - 109299
Published: Jan. 18, 2025
Language: Английский
Citations
4Journal of Ovonic Research, Journal Year: 2025, Volume and Issue: 21(1), P. 19 - 27
Published: Jan. 9, 2025
In this work, ZnO thin films were exposed to 80 keV Fe+1 ions at different fluences (1 x 1013, 1 1014, 5 1015 ions/cm2 ). With the help of X-ray diffraction (XRD), scanning electron microscopy (SEM), spectroscopic ellipsometry (SE), and four-point probe technique, we able measure structural surface morphology, optical, electrical properties both untreated irradiated films. research showed that crystallite size was diminished from its pristine level with fluence 1013 , but increased along ion fluence, resulting in higher levels crystallinity SEM images a film atthe 1014 revealed acicular patterns on surface. The resistivity decreases as increases. Consistency between findings supports idea observed behavior is due confined heating effect generated by irradiation
Language: Английский
Citations
0Journal of Inorganic and Organometallic Polymers and Materials, Journal Year: 2025, Volume and Issue: unknown
Published: March 26, 2025
Language: Английский
Citations
0Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena, Journal Year: 2024, Volume and Issue: 42(5)
Published: Aug. 26, 2024
This study explores Ag/ZnO thin films on glass (Corning 0211) substrates, which were deposited using dc/rf magnetron reactive sputtering at varying Ag-sputter powers. The impact of power physical properties, such as structural, surface, compositional, optical, and electrical is systematically explored. Grazing angle x-ray diffraction affirms a single-phase hexagonal wurtzite ZnO structure in all films, predominantly oriented along (002) normal to the substrate. Thin 90 W exhibit superior structural morphological including greatest crystallite grain size, minimum stress, roughness. Electrical studies indicate that material exhibits semiconducting nature, with its resistivity decreasing 0.8 Ω cm 95 W. At this level Ag sputter power, demonstrate low resistivity, high mobility (0.49 cm2/V s), charge carrier concentration 9.6 × 1019 cm−3, an optical transmittance 79%, band gap energy (Eg) 3.06 eV. underscores influence tailoring for optoelectronic applications.
Language: Английский
Citations
3Journal of Energy Storage, Journal Year: 2025, Volume and Issue: 116, P. 116033 - 116033
Published: March 5, 2025
Language: Английский
Citations
0Journal of Photochemistry and Photobiology A Chemistry, Journal Year: 2024, Volume and Issue: 458, P. 115929 - 115929
Published: Aug. 9, 2024
Language: Английский
Citations
1Vacuum, Journal Year: 2024, Volume and Issue: unknown, P. 113653 - 113653
Published: Sept. 1, 2024
Language: Английский
Citations
1Ceramics International, Journal Year: 2024, Volume and Issue: unknown
Published: Nov. 1, 2024
Language: Английский
Citations
0Journal of Sol-Gel Science and Technology, Journal Year: 2024, Volume and Issue: unknown
Published: Dec. 23, 2024
Language: Английский
Citations
0