Buried Interfacial Engineering with Potassium Hypophosphite to Suppress Ion Migration for Improved and Stabilized Perovskite Photodetectors DOI
Jianxiang Huang,

Huimin Zhang,

Huiying Zhu

et al.

ACS Applied Electronic Materials, Journal Year: 2025, Volume and Issue: unknown

Published: March 30, 2025

Language: Английский

Buried Interfacial Engineering with Potassium Hypophosphite to Suppress Ion Migration for Improved and Stabilized Perovskite Photodetectors DOI
Jianxiang Huang,

Huimin Zhang,

Huiying Zhu

et al.

ACS Applied Electronic Materials, Journal Year: 2025, Volume and Issue: unknown

Published: March 30, 2025

Language: Английский

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