An Improved Soft-Thresholding Exit Wave Reconstruction for Imaging Beam-Sensitive Materials DOI
Hongsheng Shi,

Yuan Lu,

Zeyu Wang

et al.

Ultramicroscopy, Journal Year: 2025, Volume and Issue: 274, P. 114154 - 114154

Published: May 4, 2025

Language: Английский

An Improved Soft-Thresholding Exit Wave Reconstruction for Imaging Beam-Sensitive Materials DOI
Hongsheng Shi,

Yuan Lu,

Zeyu Wang

et al.

Ultramicroscopy, Journal Year: 2025, Volume and Issue: 274, P. 114154 - 114154

Published: May 4, 2025

Language: Английский

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