
The Journal of Physical Chemistry C, Journal Year: 2024, Volume and Issue: unknown
Published: Nov. 26, 2024
van der Waals (vdW) forces are of interest in colloid science, biophysics, cell biology, and the field vdW heterostructures. We present a model method to quantify material properties samples routinely standard bimodal atomic force microscopy (AFM) without need establish mechanical contact with samples. The preserves high resolution AFM but enhances contrast by exploiting several transforms that lead production maps form properties, i.e., Hamaker constant, adhesion, surface energy, peak forces, energy hysteresis. show some these provide information is otherwise concealed raw channels.
Language: Английский