As
a
kind
of
non-contact
displacement
sensor
modulated
by
wavelength,
spectral
confocal
microscopy
system
has
high
measurement
accuracy
and
is
insensitive
to
object
tilt
surface
texture,
strong
anti-stray
light
ability,
which
makes
it
become
hotspot
current
research.
The
traditional
uses
wide-spectrum
source
illuminate
the
pinhole
dispersion
objective
lens
generate
on
one
side
measured
object.
focuses
different
wavelengths
at
positions
optical
axis,
converts
information
into
wavelength
information,
detects
reflected
CCD
industrial
camera
or
spectrometer
determine
peak
focused
surface,
Thus,
axial
distance
be
obtained.
In
this
paper,
based
analysis
microscopic
system,
linear
was
designed.
3.228mm
achieved
in
range
450nm
650nm,
determination
coefficient
between
greater
than
R2=0.9859.On
basis,
dual-optical
path
detection
structure
edge
By
adding
three
impurity
filters
filter
stray
except
target
results
show
that
new
sensitivity,
small
anti-interference
ability.
Optics Letters,
Journal Year:
2022,
Volume and Issue:
47(15), P. 3676 - 3676
Published: June 27, 2022
Integrated
photonics
provides
a
path
for
miniaturization
of
an
optical
system
to
compact
chip
scale
and
offers
reconfigurability
by
the
integration
active
components.
Here
we
report
chip-scale
reconfigurable
scan
lens
based
on
phased
array,
consisting
30
actively
controlled
elements
InP
integrated
photonic
platform.
By
configuring
phase
shifters,
show
scanning
nearly
diffraction-limited
focused
spot
with
full
width
at
half
maximum
size
down
2.7
µm
wavelength
1550
nm.
We
demonstrate
key
functions
needed
laser-scanning
microscope,
including
light
focusing,
collection,
steering.
also
perform
confocal
measurements
detect
reflection
selective
depths.
Optics Express,
Journal Year:
2021,
Volume and Issue:
29(3), P. 3965 - 3965
Published: Jan. 14, 2021
We
demonstrate
a
homebuilt
confocal
microscope
with
∼60
nm
axial
resolution
to
visualize
the
optical
path
length
(OPL)
of
liquid
crystals
(LCs)
inside
2-domain
alignment
LC
cell.
Since
is
sensitive
light
polarization,
it
capable
determining
orientation
by
accounting
for
OPL
variation,
ΔOPL.
The
birefringence
depends
on
measured
ΔOPL
from
two
cross-polarized
channel
detections,
which
concept
different
other
polarization-resolved
imaging
techniques,
but
relatively
simple
in
layout
and
analysis.
orientations
LCs
voltage-dependent
rotation
properties
cell
are
monitored
analyzed.
Additionally,
complicated
distribution
at
junction
domains
alignments
can
be
clearly
observed.
It
shows
great
possibilities
examining
tissue
related
disease
progression
tiny
variation
electro-optical
materials
under
an
external
field,
hardly
resolved
conventional
techniques.
We
propose
a
fast
surface
profiling
measurement
method
using
color
confocal
microscope
based
on
time-encoded
spectroscopy.
The
chromatic
microscopy
can
acquire
depth
information
at
high
speed
because
it
does
not
require
scanning.
On
the
other
hand,
in
microscopy,
is
obtained
through
wavelength
of
reflected
light,
which
difficult
for
wide
field
imaging.
By
applying
time
encoded
spectroscopy
technology,
be
light.
As
result,
we
could
obtain
3D
shape
without
scanning
by
measuring
light
CCD
over
time.
Optics Express,
Journal Year:
2022,
Volume and Issue:
30(16), P. 28817 - 28817
Published: July 15, 2022
In
this
study,
we
firstly
propose
an
optical
approach
to
investigate
the
ion
profile
of
organic
films
in
light-emitting
electrochemical
cells
(LECs)
without
any
invasive
sputtering
processes.
contrast
previous
literatures,
pure
strategy
allows
us
record
clear
and
non-destructive
images
(Ru(dtb-bpy)3(PF6)2)
consisted
layer
interferences
complex
collisions
from
bombardment
secondary
sputter
induced
ions
a
conventional
time-of-flight
mass
spectrometry.
By
using
advanced
position
sensitive
detector
(PSD)-based
Nanoscale
Confocal
Microscope,
distribution
profiles
were
successfully
acquired
based
on
observation
nanoscale
path
length
difference
by
measuring
refractive-index
variation
while
thickness
LEC
was
fixed.
Dynamic
time-dependent
displayed
migration
process
under
100
V
applied
bias
at
two
ends
LEC.
This
technique
opens
up
new
avenue
towards
future
investigations
distributions
inside
organic/inorganic
materials,
Li-ion
batteries,
or
micro-fluid
channels
damaging
materials
disturbing
device
operation.
An
advanced
confocal
microscope
with
nanoscale
depth
resolutions
and
the
capability
for
rapid
capture
of
3D
surface
topography
was
presented.
The
proposed
shows
great
promise
optical
testing
electronic
or
photonic
elements.
As
a
kind
of
non-contact
displacement
sensor
modulated
by
wavelength,
spectral
confocal
microscopy
system
has
high
measurement
accuracy
and
is
insensitive
to
object
tilt
surface
texture,
strong
anti-stray
light
ability,
which
makes
it
become
hotspot
current
research.
The
traditional
uses
wide-spectrum
source
illuminate
the
pinhole
dispersion
objective
lens
generate
on
one
side
measured
object.
focuses
different
wavelengths
at
positions
optical
axis,
converts
information
into
wavelength
information,
detects
reflected
CCD
industrial
camera
or
spectrometer
determine
peak
focused
surface,
Thus,
axial
distance
be
obtained.
In
this
paper,
based
analysis
microscopic
system,
linear
was
designed.
3.228mm
achieved
in
range
450nm
650nm,
determination
coefficient
between
greater
than
R2=0.9859.On
basis,
dual-optical
path
detection
structure
edge
By
adding
three
impurity
filters
filter
stray
except
target
results
show
that
new
sensitivity,
small
anti-interference
ability.
