Read & Write Stability of CNTFET 6T SRAM Cell: A Comprehensive Analysis
Journal of Electronic Testing,
Journal Year:
2025,
Volume and Issue:
41(1), P. 15 - 25
Published: Feb. 1, 2025
Language: Английский
Energy-efficient design of quaternary logic gates and arithmetic circuits using hybrid CNTFET-RRAM technology
Physica Scripta,
Journal Year:
2024,
Volume and Issue:
99(8), P. 085119 - 085119
Published: July 22, 2024
Abstract
Multi-valued
logic
(MVL)
extends
binary
by
providing
a
framework
to
represent
complex
systems
with
more
than
two
truth
values.
MVL
was
introduced
confront
the
enormous
interconnect
issue
associated
in
implementing
presnt
day
nanoelectronic
architectures.
This
paper
delves
into
circuit
design,
computational
aspects,
and
practical
applications
of
quaternary
system,
which
is
type
four
The
multi-threshold
property
carbon
nanotube
field-effect-transistors
(CNTFETs),
combined
ability
resistive
random-access
memory
(RRAM)
store
multiple
resistance
values,
has
enabled
design
gates
arithmetic
circuits.
A
new
CNTFET-based
architecture
been
proposed
implement
compatible
existing
technologies.
Quaternary
such
as
inverter,
NAND,
NOR,
circuits
including
decoder,
half
adder,
multiplier
have
designed.
power-delay-product
(PDP)
62.38%,
93.4%,
80.29%,
14.79%,
20%
less
least
PDP
designs
under
consideration.
static
power
reduction
due
effecciency
high
OFF
state
offered
integrating
RRAM
explored.The
subject
various
types
parameter
variations
validate
thir
proper
functionality
presence
these
variations.
Language: Английский
Design analysis of a low-power, high-speed 8 T SRAM cell using dual-threshold CNTFETs
Physica Scripta,
Journal Year:
2024,
Volume and Issue:
99(8), P. 085237 - 085237
Published: July 19, 2024
Abstract
Recently,
carbon
nanotube
field-effect
transistors
(CNTFETs)
have
garnered
significant
attention
from
VLSI
engineers
due
to
their
exceptional
electrical
properties.
This
paper
proposes
a
novel
high-speed,
low-power
eight-transistor
(8
T)
static
random-access
memory
(SRAM)
cell
based
on
32-nm
CNTFET
technology.
The
SRAM
was
simulated
using
the
HSPICE
tool
with
V
DD
of
0.9
V.
high-speed
and
characteristics
design
are
attributed
high
subthreshold
slope
carrier
mobility
metal-oxide-semiconductor
transistor
(MOSFET)-like
CNTFETs
utilized
in
simulations.
implementation
dual
threshold
transistors,
coupled
transmission
gate
for
bitline
access,
contributes
enhanced
performance.
Key
performance
metrics
such
as
noise
margins,
power
consumption,
delay,
quality
metric
(SEQM)
proposed
been
evaluated
compared
existing
CNTFET-based
designs.
demonstrates
reductions
73.73%,
43.18%,
58.70%
read
power,
write
hold
respectively,
lowest
respective
values
other
examined
ranks
second,
third,
second
margin
(WSNM),
(HSNM),
(RSNM),
among
Additionally,
exhibits
least
sensitivity
parametric
variations
SEQM,
which
provides
comprehensive
assessment
access
times,
usage
cell,
has
calculated.
SEQM
is
10.6,
1.89,
13.15,
1.82
times
higher
than
that
C6T,
BLP8T,
Mani’s
10
T,
LP8T,
respectively.
Language: Английский