Band-mixing’s k-dependence in InGaAs quantum wells unveiled by pump-probe experimental data analyzed with a k ⋅ p -based intersubband scattering model
J. Z. Bai,
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Rebecca Mac,
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Dayan Ban
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et al.
New Journal of Physics,
Journal Year:
2025,
Volume and Issue:
27(4), P. 043018 - 043018
Published: April 1, 2025
Abstract
Using
a
first-order
k
⋅
mathvariant="bold">p
model
for
electron
intersubband
scattering
in
quantum
wells
(QW),
our
group
re-analyzed
pump-probe
experiments
performed
the
mid-nineties
that
investigated
and
intrasubband
dynamics
two
InGaAs/AlInAs
QWs
grown
same
molecular
beam
epitaxy
(MBE)
laboratory.
This
work
confirms
measured
lifetime
can
only
be
interpreted
through
rigorous
approach
not
considers
hyperbolic
subband
dispersion
but
also
band-mixing’s
k
-dependence,
which
slows
down
all
mechanisms.
The
latter
includes
enhanced
wavefunction
confinement
with
.
Concomitantly,
this
analysis
range
of
interface
roughness
parameters
(IFR)
potential
alloy
disorder
(AD),
whose
values
are
very
important
designing
many
existing/new
devices.
Just
by
using
one-band
model,
overall
2–1
rate
is
∼66%
overestimated
QW
tuned
at
λ
21
∼
5
µ
m,
while
eight-band
good
agreement
experimental
data
obtained
properly
choosing
these
material
parameters.
However,
due
to
inherent
time
resolution
fact
AD
IFR
scatterings
processes
nature,
fitted
large
uncertainty.
suggested
line
what
typically
used
cascade
laser
simulations,
smaller.
Pump-probe
sufficient
capture
accuracy
and,
therefore,
should
associated
other
characterization
techniques,
such
as
ultra-high
vacuum
scanning
tunneling
microscope
or
tomography.
devices’
simulation
tools
could
benefit
from
derived
work,
above
all,
reaffirms
modeling
optimizing
devices,
it
crucial
consider
correct
but,
most
band-mixing,
strongly
-dependent.
Language: Английский
First-order k·p methods for electron intersubband scatterings in quantum wells
Rebecca Mac,
No information about this author
Dayan Ban,
No information about this author
Emmanuel Dupont
No information about this author
et al.
Physical review. B./Physical review. B,
Journal Year:
2024,
Volume and Issue:
110(16)
Published: Oct. 21, 2024
Language: Английский