Small Methods, Journal Year: 2023, Volume and Issue: 8(8)
Published: Dec. 6, 2023
Gallium oxide (Ga
Language: Английский
Small Methods, Journal Year: 2023, Volume and Issue: 8(8)
Published: Dec. 6, 2023
Gallium oxide (Ga
Language: Английский
Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal Year: 2024, Volume and Issue: 42(4)
Published: May 15, 2024
Pt/(100) β-Ga2O3 Schottky barrier diodes were fabricated using a plate cleaved from the crystal grown by Czochralski method. Their electroconductive and photoelectric characteristics studied. The following values obtained: height (1.69/1.62/1.74 eV), ideality coefficient (1.09/1.14), saturation current density (9.91 × 10–15 A/cm2), diode series resistance (7.98 kΩ), net donor concentration [(1.8–2.4) 1018 cm–3]. demonstrate high rectification ratio of 1010 at an applied voltage ± 1 V relatively low experimental value leakage ∼10–11 A/cm2. These structures are solar-blind also capable operating in self-powered mode. highly sensitive to short-wave ultraviolet radiation with wavelength λ ≤ 265 nm. maximum responsivity (20.4 A/W), external quantum efficiency (1.2 104%), detectivity (9.6 1015 Hz0.5 cm W–1) registered under exposure irradiation = 210 nm −1 V. operation mode 12.3 A/W 7.2 103%, respectively. showed rise decay times for photodiode based on Ga2O3: 14 30 ms,
Language: Английский
Citations
11International Journal of Hydrogen Energy, Journal Year: 2024, Volume and Issue: 81, P. 313 - 345
Published: July 24, 2024
Language: Английский
Citations
10Journal of Vacuum Science & Technology A Vacuum Surfaces and Films, Journal Year: 2024, Volume and Issue: 42(2)
Published: Feb. 27, 2024
A new growth approach, based on the hot-wall metalorganic chemical vapor deposition concept, is developed for high-quality homoepitaxial of Si-doped single-crystalline β-Ga2O3 layers (010)-oriented native substrates. Substrate annealing in argon atmosphere 1 min at temperatures below 600 °C proposed formation epi-ready surfaces as a cost-effective alternative to traditionally employed process oxygen-containing with time duration h about 1000 °C. It shown that on-axis rocking curve widths exhibit anisotropic dependence azimuth angle minima in-plane direction parallel [001] and maximum [100] both substrate layer. The are demonstrated have excellent structural properties β-Ga2O3(020) full-widths half-maximum low 11 arc sec, which lower than corresponding one substrates (19 sec), even highly (low 1019 cm−3 range) layers. Furthermore, anisotropy layer substantially reduced respect substrate. Very smooth surface morphology epilayers root mean square roughness value 0.6 nm over 5 × μm2 area achieved along high electron mobility 69 cm2 V−1 s−1 free carrier concentration n=1.9×1019 cm−3. These values compare well state-of-the-art parameters reported literature β-Ga2O3(010) respective Si doping levels. Thermal conductivity 17.4 Wm−1K−1 determined [010] 300 K, approaches bulk crystal (20.6 Wm−1K−1). This result explained by weak boundary effect dislocation density
Language: Английский
Citations
8Journal of Semiconductors, Journal Year: 2024, Volume and Issue: 45(4), P. 042502 - 042502
Published: April 1, 2024
Abstract High-speed solar-blind short wavelength ultraviolet radiation detectors based on κ ( ε )-Ga 2 O 3 layers with Pt contacts were demonstrated and their properties studied in detail. The deposited by the halide vapor phase epitaxy patterned GaN templates sapphire substrates. spectral dependencies of photoelectric structures analyzed interval 200–370 nm. maximum photo to dark current ratio, responsivity, detectivity external quantum efficiency determined as: 180.86 arb. un., 3.57 A/W, 1.78 × 10 12 Hz 0.5 ∙cm∙W −1 2193.6%, respectively, at a 200 nm an applied voltage 1 V. enhancement photoresponse was caused decrease Schottky barrier Pt/ )−Ga interface under exposure. could functionalize self-powered mode due built-in electric field interface. responsivity 254 zero 0.9 mA/W 0.46%, respectively. rise decay times did not exceed 100 ms.
Language: Английский
Citations
6Optical Materials X, Journal Year: 2025, Volume and Issue: unknown, P. 100409 - 100409
Published: March 1, 2025
Language: Английский
Citations
0Materialia, Journal Year: 2025, Volume and Issue: unknown, P. 102415 - 102415
Published: April 1, 2025
Language: Английский
Citations
0Optical Materials, Journal Year: 2023, Volume and Issue: 145, P. 114424 - 114424
Published: Oct. 9, 2023
Language: Английский
Citations
6Crystals, Journal Year: 2024, Volume and Issue: 14(2), P. 123 - 123
Published: Jan. 26, 2024
Vertical Schottky barrier diodes based on an ion beam sputter (IBS)-deposited β-Ga2O3 film a single-crystalline (2¯01) unintentionally doped (UID) with Ni contact were developed. To form ohmic Ti/Ni contacts, the IBS-Ga2O3/UID structures wet-etched, and indium tin oxide (ITO) intermediate semiconductor layer (ISL) was deposited opposite surface of UID β-Ga2O3. The IBS-deposited Ga2O3 polycrystalline semi-insulating. Low leakage currents, rectification ratios 3.9 × 108 arb. un. 3.4 106 un., ideality factors 1.43 1.24, heights 1.80 eV 1.67 as well breakdown voltages 134 V 180 achieved for without ITO-ISL, respectively. area IBS-Ga2O3 acted thin dielectric and, together preliminary wet etching, provided low currents relatively high heights. Diodes Ni/IBS-deposited demonstrated first time.
Language: Английский
Citations
2Ceramics International, Journal Year: 2024, Volume and Issue: 50(19), P. 36428 - 36439
Published: July 3, 2024
Language: Английский
Citations
1Small Methods, Journal Year: 2023, Volume and Issue: 8(8)
Published: Dec. 6, 2023
Gallium oxide (Ga
Language: Английский
Citations
2