Observation of electronic and structural transitions in two-dimensional ferroelastic semiconductor of Nb2GeTe4 via pressure manipulation
Applied Physics Letters,
Journal Year:
2025,
Volume and Issue:
126(11)
Published: March 1, 2025
Nb2GeTe4,
a
two-dimensional
ferroelastic
semiconductor,
has
garnered
intense
research
interest
due
to
its
nontrivial
physicochemical
characteristics
of
high
carrier
mobility
as
well
extraordinary
ferroelasticity
and
optical
absorbance
along
with
potential
applications
in
electronic
optoelectronic
devices.
In
this
work,
the
high-pressure
structural,
vibrational,
electrical
transport
properties
Nb2GeTe4
up
60.0
GPa
under
different
hydrostatic
environments
were
systematically
studied
by
Raman
spectroscopy,
conductivity,
first-principles
theoretical
calculations.
Under
non-hydrostatic
compression,
experienced
metallization
at
11.8
originating
from
closure
bandgap
considerable
compression
interlayer
distance
sequential
an
isostructural
phase
transition
(IPT)
26.5
GPa.
The
comparable
pressure
pronounced
delay
IPT
∼4.0
condition
can
be
reasonably
interpreted
influence
deviatoric
stress.
Upon
decompression,
was
demonstrated
reversible
possible
structural
destruction
environments.
Moreover,
underwent
Ohmic-to-super-Ohmic
conversion
1000
mV
pressure,
which
presumably
caused
higher
sinusoidal
voltage
than
thermal
voltage.
These
findings
enrich
our
foundational
comprehension
on
thereby
fostering
Language: Английский
Structural and Electronic Phase Transitions in Three Stable Tin–Sulfur Metallic Chalcogenides under High Pressure
Inorganic Chemistry,
Journal Year:
2024,
Volume and Issue:
63(42), P. 19783 - 19797
Published: Oct. 9, 2024
As
a
representative
homologous
series,
tin-bearing
metallic
chalcogenides
(SnxSy)
have
sparked
considerable
attention
because
of
their
stoichiometric
compositions
and
structural
diversities.
In
this
work,
three
stable
compounds,
SnS,
Sn2S3,
SnS2,
were
screened
from
SnxSy
comprehensive
investigation
on
electrical
transport
properties
was
performed
up
to
60.1
GPa
using
diamond
anvil
cell
(DAC)
under
different
hydrostatic
environments.
Upon
nonhydrostatic
compression,
SnS
underwent
the
Pnma-to-Cmcm
transition
accompanied
by
metallization
at
7.6
GPa,
followed
Cmcm-to-Pm3̅m
transformation
17.8
GPa.
For
pressure-induced
isostructural
phase
(IPT)
occurred
successively
31.2
46.6
respectively.
an
intermediate
composition,
Sn2S3
first
experienced
IPT
10.8
then,
concomitantly
with
16.9
analogous
high-pressure
routes
SnS2.
The
0.6–5.4
pressure
hysteresis
detectable
for
transitions
quasi-hydrostatic
conditions
owing
influence
deviatoric
stress.
consideration
our
Raman
scattering
conductivity
results,
systematic
construction
pressure-phase
state
diagram
not
only
unveils
its
composition–structure–property
relation
but
also
advances
in-depth
exploration
other
IVA–VIA
chalcogenides.
Language: Английский
Pressure-induced photocurrent enhancement and metallization in van der Waals compound SiTe2
Zhongyang Li,
No information about this author
Xiaohui Zeng,
No information about this author
Kejun Bu
No information about this author
et al.
Applied Physics Letters,
Journal Year:
2024,
Volume and Issue:
125(6)
Published: Aug. 5, 2024
Layered
van
der
Waals
(vdW)
dichalcogenides
are
distinguished
by
their
unique
crystal
structures
and
high
structural
tunability,
rendering
them
suitable
for
applications
in
optics
optoelectronics.
Despite
significant
processes,
some
fundamental
questions
remain
two-dimensional
(2D)
vdW
dichalcogenides,
such
as
clarifying
detailed
structure–property
relationship
further
improving
the
optoelectronic
performance.
Herein,
applying
pressure
to
tune
structure
2D
dichalcogenide
SiTe2,
we
realized
a
five
orders
of
magnitude
boost
photocurrent
at
8
GPa.
Such
an
enhancement
is
attributed
bandgap
narrowing
increased
carrier
concentration.
Furthermore,
closing
metallization
were
observed
15.4
GPa,
suggesting
change
electronic
upon
compression.
This
study
not
only
elucidates
intriguing
pressure-induced
behavior
SiTe2
but
also
paves
way
harnessing
pressure-responsive
properties
advanced
systems.
Language: Английский