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Language: Английский

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0

Optimizing interfacial thermal resistance in GaN/AlN heterostructures: The impact of AlN layer thickness DOI

Juan Xue,

Fengyi Li, Aoran Fan

et al.

International Journal of Heat and Mass Transfer, Journal Year: 2024, Volume and Issue: 239, P. 126629 - 126629

Published: Dec. 27, 2024

Language: Английский

Citations

0