IEEE Electron Device Letters, Journal Year: 2024, Volume and Issue: 45(10), P. 1879 - 1882
Published: Aug. 2, 2024
Language: Английский
IEEE Electron Device Letters, Journal Year: 2024, Volume and Issue: 45(10), P. 1879 - 1882
Published: Aug. 2, 2024
Language: Английский
Journal of Luminescence, Journal Year: 2024, Volume and Issue: unknown, P. 121002 - 121002
Published: Nov. 1, 2024
Language: Английский
Citations
2Applied Physics Letters, Journal Year: 2024, Volume and Issue: 125(19)
Published: Nov. 4, 2024
Ga2O3 has been considered as one of the most suitable materials for x-ray detection, but its detection performance is still at a low level due to limitation quality and absorbance, especially hard x-ray. In this work, effects growth temperature miscut angle sapphire substrate on crystal thin films were investigated based MOCVD technique. It was found that mode transformed from island step-flow using substrates increasing temperature, which accompanied by improvement reduction density trapped states. with optimal finally prepared 4° 900 °C. The detector film shows good response sensitivity 3.72 × 105μC·Gyair−1·cm−2. Furthermore, impacts trap in depth, mechanism photoconductive gain thin-film analyzed.
Language: Английский
Citations
2Applied Physics Letters, Journal Year: 2024, Volume and Issue: 124(25)
Published: June 17, 2024
The energetic positions of the two Fe dopant levels in bandgap β-Ga2O3 are determined to be at 3.05(±0.05) and 3.85(±0.05) eV below conduction band minimum from transmission measurements employing a sub-picosecond tunable ultraviolet laser radiation source. A further measurement quantum efficiency photoelectron emission Fe:Ga2O3(010) photocathode is consistent with obtained absorption data dominant optical phonon assisted Franck–Condon mechanism, while also providing an estimate 100 ps for electron lifetime.
Language: Английский
Citations
1ACS Applied Electronic Materials, Journal Year: 2024, Volume and Issue: unknown
Published: July 26, 2024
This study investigates the shift of charge neutral point (CNP) 700 nm-thick α-Ga2O3 metal–semiconductor-metal (MSM) devices in response to X-ray exposure and relaxation time. The CNP is mainly attributed generation recombination positive ions thin film. These findings contribute understanding MSM detectors have potential be applied various fields imaging sensing technologies.
Language: Английский
Citations
1IEEE Electron Device Letters, Journal Year: 2024, Volume and Issue: 45(10), P. 1879 - 1882
Published: Aug. 2, 2024
Language: Английский
Citations
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